Keyphrases
P-i-n Junction
100%
Infrared Photodetector
100%
Nanowires
50%
GaAsSb
50%
Annealing Effect
33%
Material Quality
33%
Molecular Beam Epitaxy
33%
Photodetector Applications
33%
Device Performance
25%
Surface States
25%
State Surface
16%
Surface Order
16%
Fabrication Processing
16%
Ni-P
16%
Composition Redistribution
16%
Growth Technology
16%
Post-growth Annealing
16%
Micro-photoluminescence
16%
Dark Current
16%
Simple Technique
16%
Compositional Homogeneity
16%
Charge Carriers
16%
Dopant
16%
Material Versatility
16%
Nanomaterials
16%
Heterostructure
8%
Educational Materials
8%
Educational Component
8%
Compound Semiconductors
8%
Research Component
8%
Postdoctoral Research
8%
Scanning Electron Microscopy
8%
Large Surfaces
8%
Raman Spectroscopy
8%
Defect States
8%
Core-shell
8%
Noise Source
8%
Surface-to-volume Ratio
8%
Research Equipment
8%
Material Design
8%
Unique Characteristics
8%
Undergraduate Students
8%
Low Frequency Noise Measurements
8%
Underrepresented Students
8%
Low Temperature
8%
Device Fabrication
8%
X Ray Diffraction
8%
Near-infrared
8%
Quality Performance
8%
Deleterious Effects
8%
Temperature Effect
8%
Comprehensive Investigation
8%
Nanodevices
8%
Performance Parameters
8%
Operating State
8%
State Universities
8%
T-states
8%
Full Potential
8%
Characterization Tools
8%
Electronic Properties
8%
Characterization Techniques
8%
Collection Efficiency
8%
Undergraduate Degree
8%
North Carolina
8%
Engineering
Photodetector
50%
Nanowires
50%
Surface State
50%
Annealing Effect
33%
Material Quality
33%
Device Performance
25%
Collection Efficiency
16%
Operating State
16%
Nanomaterial
16%
Ray Diffraction
8%
Core-Shell
8%
Frequency Noise
8%
Volume Ratio
8%
Charge Carrier
8%
Compound Semiconductor
8%
Dopants
8%
Temperature Dependence
8%
Heterojunctions
8%
Performance Parameter
8%
Defects
8%
One Dimensional
8%
Low-Temperature
8%
Material Science
Nanowire
50%
Microphotoluminescence
16%
Materials Design
8%
Nanocrystalline Material
8%
Electronic Property
8%
Heterojunction
8%
Compound Semiconductor
8%
Device Fabrication
8%
X-Ray Diffraction
8%
Raman Spectroscopy
8%
Scanning Electron Microscopy
8%
Doping (Additives)
8%
Charge Carrier
8%
Annealing
8%