Keyphrases
Collaborative Research
100%
Value Variation
100%
Parameter Values
100%
VLSI Circuits
100%
Performance Analysis
100%
Nanoscale Engineering
100%
Robustness Analysis
71%
Performance Robustness
71%
Circuit Performance
42%
Sampling numbers
28%
Circuit System
28%
Monte Carlo Method
14%
VLSI Technology
14%
Process Variation
14%
Monte Carlo Sampling Method
14%
Circuit Component
14%
Computational Efficiency
14%
Circuit Parameters
14%
Lithography
14%
Critical Polynomials
14%
VLSI Circuit Design
14%
VLSI Design
14%
Performance Variation
14%
Nominal Value
14%
Electrical Parameters
14%
Silicon Wafer
14%
Statistical Analysis Method
14%
Computation Complexity
14%
Process Uncertainty
14%
Transformative Value
14%
Stochastic Analysis Methods
14%
Multiple Disciplines
14%
Collaboration with Industry
14%
Graduate Education
14%
System Performance
14%
Knowledge-how
14%
Computer Science
Circuit Systems
100%
Performance Analysis
100%
Parameter Value
100%
Critical System
50%
Systems Performance
50%
Performance Variation
50%
Theoretical Basis
50%
Process Variation
50%
Computation Complexity
50%
Frequency Domain
50%
Engineering
Nanoscale
100%
Performance Analysis
100%
VLSI Circuits
100%
Circuit Performance
37%
Time Domain
25%
Frequency Domain
25%
Silicon Wafer
12%
Feature Size
12%
Critical System
12%
Systems Performance
12%
Circuit Design
12%
Lithography
12%
Computation Complexity
12%
Circuit Parameter
12%
Process Variation
12%
Theoretical Basis
12%