Detalles del proyecto
Descripción
This project, acquiring a new high resolution microscope, aims to allow users to analyze the performance of electronic devices and systems. With a user friendly interface and the use of intuition, the instrument is expected to maximize its accessibility for on-site use and for off campus users. The platform will be used for teaching, education, and outreach. This effort is shared by six universities in Florida. The effort enables:
- Remote access capability to reach over 500 students every year both on and off campus;
- Material and expertise on hardware security related topics for educators to incorporate in their classroom curricula;
- Help to bring experts into their classrooms to discuss real-world applications; and
- Exposure of undergraduates to advanced microscopy techniques.
This new high resolution photon emission and electro-optical microscope enables the analysis by visualizing the transistor functionality non-destructively. When analyzing performance in this fashion, maximum impact is gained from multiple features such as:
- New high sensitive detectors that enable high resolution;
- Laser scanning configuration that enable static and dynamic failure analysis;
- Static laser scanning stimulation that contribute to identify the source of shorts and resistive defects; and
- Electro-optical probing and frequency mapping that enable rapid identification of regions of interest.
The unique capabilities of the instrument constitute a critical enabling parameter for research in hardware and system security areas. These include:
- Counterfeit detection by providing more detailed data than general electrical tests in less expensive and non-destructive manner;
- Semi-invasive physical attacks by enabling advanced contactless probing techniques and laser injection to measure circuit activity;
- Trojan detection by performing trust analysis of fabricated integrated circuits for validation of security and trust; and
- Reverse and anti-reverse engineering by complementing conventional reverse engineering and extracting the intellectual property blocks critic information.
Estado | Finalizado |
---|---|
Fecha de inicio/Fecha fin | 1/10/17 → 30/9/20 |
Enlaces | https://www.nsf.gov/awardsearch/showAward?AWD_ID=1726716 |
Financiación
- National Science Foundation: USD999,804.00
!!!ASJC Scopus Subject Areas
- Ingeniería eléctrica y electrónica
- Redes de ordenadores y comunicaciones