Keyphrases
Formation Energy
100%
External Excitation
60%
Charged Point Defects
60%
Fermi Level
60%
Defect Formation
50%
Fermi Energy
40%
Wide Bandgap Materials
30%
Growth Characterization
20%
Material Control
20%
Quasi-Fermi Levels
20%
Energy Gap
20%
Radiative Defects
20%
Device Efficiency
20%
Processing Framework
20%
Excitation Source
20%
Deep Ultraviolet LED
20%
Conceptual Approach
20%
E-beam Irradiation
20%
Optical Studies
20%
Conductivity Type
20%
Ultra-wide Bandgap
20%
Growth Experiment
20%
Electrical Studies
20%
LED Structure
20%
Oxide Systems
20%
Level Control
20%
Ultraviolet Light-emitting Diode (UV-LED)
20%
Power Electronics
10%
Non-radial
10%
Natural Resources
10%
Compound Semiconductors
10%
Aluminum Gallium Nitride (AlGaN)
10%
Process Conditions
10%
Insulator
10%
Pollution Detection
10%
Effluent
10%
Professional Growth
10%
Potable Water
10%
Minority Students
10%
Material Design
10%
Disinfection
10%
III-nitrides
10%
Steady-state Conditions
10%
Computational Methods
10%
Device Fabrication
10%
Management Process
10%
Control Scheme
10%
Levels Management
10%
Optical Properties
10%
Wide Bandgap
10%
Material Characterization
10%
Group Members
10%
Computational Effort
10%
P-type
10%
Full Potential
10%
Device Performance
10%
Material Development
10%
Electronic Properties
10%
Design Process
10%
Band Gap
10%
Engineering
Based Optoelectronic Device
100%
Defects
100%
Engineering
100%
Fermi Level
30%
Formation Energy
23%
Fermi Energy
15%
Level Control
15%
Energy Engineering
15%
Process Condition
7%
Light-Emitting Diode
7%
Disinfection
7%
Group Members
7%
Control Scheme
7%
Management Process
7%
Beam Irradiation
7%
Natural Resources
7%
Excitation Source
7%
Oxide System
7%
State Condition
7%
Broader Class
7%
Device Performance
7%
Optoelectronics
7%
Compound Semiconductor
7%
Nitride
7%
Ultraviolet Light
7%
Power Electronics
7%
Computational Effort
7%
Fundamental Problem
7%
Energy Gap
7%
Tasks
7%
Material Science
Point Defect
100%
Electronic Property
8%
Optical Property
8%
Compound Semiconductor
8%
Device Efficiency
8%
Potable Water
8%
Device Fabrication
8%
Oxide Compound
8%
Nitride Compound
8%
Light-Emitting Diode
8%