Acquisition of a Multifunctional PicoIndenter System for in situ Correlative Materials Characterization of Small-Scaled Structures

Acquisition of a Multifunctional PicoIndenter¨ System for in situ Correlative Materials Characterization of Small-Scaled Structures Micro- and nano-scaled materials can exhibit new fundamental properties. However, materials characterization of them is extremely challenging. In order to reveal the true structure-property relations of these small-scaled materials, novel characterization techniques combining both quantitative measurements and high spatial resolution imaging capability are needed. Here, we propose to acquire a PicoIndenter¨ System (ÒSYSTEMÓ) manufactured by Hysitron, Inc. to perform in situ multifunctional characterization of small-scaled materials that are interested to DoD (e.g., low-density armor materials, beyond graphene two-dimensional (2D) nanomaterials, non-metal plasmonic nanomaterials, semiconductors for optoelectronic devices, etc.). Briefly, the SYSTEM consists of a PI 88 SEM PicoIndenter¨, a PI 95 TEM PicoIndenter¨ and other accessories. Both PicoIndenters¨ are depth-sensing nanomechanical test instruments which can be interfaced with electron microscopes, enabling us to directly correlate property information (e.g., load, displacement) with the changes of materialsÕ microstructures. Although the PicoIndenters¨ were originally designed for nanoindentation only, the other proposed accessories (e.g., Electrical Characterization Module, nanoScratch capability, nanoDynamicª Mode, Push-to-Pull device, Electrical Push-to-Pull device) significantly expand their applications to realize the characterization of multifunctionality of small-scaled materials. With the unique configuration we are proposing, the SYSEM will be able to perform in situ multifunctional correlative materials characterization (i.e., mechanical, electrical and optical) on a variety of small-scaled materials including pillars, thin films, nanoparticles, nanowires, 2D nanomaterials, etc. The combination of both quantitative property measurement and high resolution imaging capability will generate tremendous new insights to under the unique behavior of small-scaled materials. The successful acquisition of the SYSTEM will ¥ Significantly strengthen our research infrastructure in the field of materials science and nanotechnology and make UNC Charlotte the only university in Southeastern United States which has this research capability. ¥ Support several pioneering research projects from eight research groups of four departments to (i) study effects of planar defects on mechanical properties of boron carbide nanowires, (ii) explore the true deformation mechanism in Mg alloy with the long period stacking order (LPSO) structures, (iii) investigate plasmomechanics in non-metal plasmonic nanomaterials, (iv) understand strain-induced effects in semiconductors and transition-metal dichalcogenides (TMDs), and (v) study the photophysical properties of porphyrin single crystals. Provide unique training opportunities to undergraduate and graduate students who participate in those research projects. ¥ Provide unprecedented educational resources to more than three hundred fifty undergraduates and fifty graduate students each year who take the core and advanced level courses in the field of MSN. ¥ Provide unique outreach resources to inspire more high school students and teachers to further their career in the fields of science, technology, engineering and mathematics (STEM) thorough our collaboration with the Charlotte Engineering College High School and the Charlotte Country Day School. ¥ Attract more industrial partners to use our existing electron microscopy facility, and develop new collaborative projects.