Keyphrases
Autonomous Underwater Vehicle
16%
Blue Technology
33%
Buoyancy
16%
Capacitors
16%
Component Behavior
33%
Component Packaging
33%
Component Parameters
33%
Connector
33%
Converter Topology
16%
Critical Model
33%
Derived Model
16%
Design Test
16%
Design-build
16%
Deterioration Mechanism
33%
Electric Power
16%
Electric Test
33%
Electrical Components
33%
Electrical Load
16%
Electrical System
16%
Electronic Circuit
16%
Electronic Components
16%
Electronic System
16%
Energy Systems
33%
Evaluation Parameters
33%
Experimental Validation
16%
Exploration System
16%
Failure Parameters
33%
Fault Mechanism
16%
Film Capacitor
33%
Filter Device
33%
Hardware Resources
16%
High Cost
16%
High Failure Rate
16%
High Hydrostatic Pressure
33%
High Power
16%
Hydrostatic Pressure
50%
Impact Review
16%
Implosion
33%
Inductors
66%
Marine Exploration
33%
Material Selection
16%
Microgrid
16%
Ocean Exploration
33%
Oil Extraction
33%
Operating Conditions
16%
Packaging Materials
16%
Parameter Drift
33%
Passive Energy
33%
Penetrator
33%
Power Components
66%
Power Conversion System
33%
Power Conversion Unit
33%
Power Converter Topology
33%
Power Electronic Components
66%
Power Electronic Systems
50%
Power Processing Unit
33%
Power System
16%
Practical Demonstration
16%
Pressure Compensating
66%
Pressure Model
33%
Pressure Tolerance
100%
Pressure-induced
33%
Remotely Operated Underwater Vehicle
33%
Review Criteria
16%
Selection Topology
33%
System Behavior
16%
Technology System
16%
Test Station
33%
Testing Method
16%
Thermal Pressure
33%
Thermoelectric Properties
50%
Thick Metal
33%
Underwater Test
33%
Wide Band Gap Semiconductors
16%
Engineering
Autonomous Underwater Vehicle
16%
Electrical Load
16%
Energy Systems
33%
Failure Rate
16%
Filtration
16%
Microgrid
16%
Networks (Circuits)
16%
Oil Production
33%
Packaging Material
16%
Penetrator
33%
Power Conversion
16%
Power Conversion System
33%
Power Converter
16%
Power Electronics
50%
Processing Unit
33%
Related Factor
16%
Simplifies
16%
Surrounding Pressure
33%
System Behavior
16%
System Technology
16%
Test Procedure
33%
Test Station
33%
Wide Bandgap Semiconductor
16%