Karimian, N.,
Woodard, D. L. & Forte, D.,
Jul 1 2017,
IEEE International Joint Conference on Biometrics, IJCB 2017. Institute of Electrical and Electronics Engineers Inc.,
p. 143-151 9 p. (IEEE International Joint Conference on Biometrics, IJCB 2017; vol. 2018-January).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution